79 [Paper Accepted] IEEE TED  admin 2015-04-14 2477
The following paper has been accepted for publication as a regular paper in the IEEE Transactions on Electron Devices.

Author : Hanwool Jeong, Younghwi Yang, Seung Chul Song, Joseph Wang, Geoffrey Yeap, and Seong-Ook Jung

Title : Variation-Aware Figure of Merit for Integrated Circuit in Near-Threshold Region
Publiciation : IEEE Transactions on Electron Devices (TED)

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