106 [Paper Accepted] IEEE TVLSI  admin 2016-02-05 2477
The following paper has been accepted for publication as a regular paper in the IEEE Transactions on Very Large Scale Integration Systems

Author :Sara Choi, Taehui Na, Jisu Kim, Junpill Kim, Seung H. Kang, and Seong-Ook Jung
Title : Corner-Aware Dynamic Gate Voltage Scheme to Achieve High Read Yield in STT-RAM
Publiciation : IEEE Transactions on Very Large Scale Integration Systems (TVLSI)

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